Wappingers Falls, NY, United States of America

Angelo M Giaimo


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 19(Granted Patents)


Company Filing History:


Years Active: 2002

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1 patent (USPTO):Explore Patents

Title: **Inventor Spotlight: Angelo M. Giaimo**

Introduction

Angelo M. Giaimo is an innovative inventor based in Wappingers Falls, New York, known for his significant contributions to the field of semiconductor testing. With one patent to his name, Giaimo has made impactful advancements in the way silicon semiconductor device wafers and chips are assessed for integrity.

Latest Patents

Giaimo's notable patent is for a "Wafer probe interface arrangement with nonresilient probe elements and support structure." This invention introduces a nonresilient rigid test probe arrangement specifically designed for testing the integrity of silicon semiconductor device wafers or chips. The innovation effectively eliminates pliant conditions that current test fixtures encounter, which can hinder achieving satisfactory test results with rigid probes. The test system interface assembly features a rigid ceramic substrate that forms a pedestal for electrical contact, along with a PC board positioned on the opposite side. A clamp ring secures the PC board to the test head system, ensuring precision in reference surfaces, while pogo pin connectors facilitate the connection between the PC board and the test head system. The incorporation of a stiffening element further enhances the rigidity of the test probe arrangement.

Career Highlights

Angelo M. Giaimo is associated with the International Business Machines Corporation (IBM), where he applies his expertise to further innovations in the field of semiconductor technology. His work contributes to IBM's reputation as a leader in technology and hardware solutions, particularly in semiconductor testing methodologies.

Collaborations

Throughout his career, Giaimo has collaborated with esteemed colleagues, including Gobinda Das and Steven J. Duda. Their joint efforts in the laboratory and during research projects have fostered an environment of creativity and advancement, benefiting the technology community as a whole.

Conclusion

Angelo M. Giaimo represents the spirit of innovation that drives the technology sector forward. With his patent for the wafer probe interface arrangement, he has laid the groundwork for more reliable testing procedures within semiconductor devices, showcasing the crucial role inventors play in technological advancements. As he continues his work at IBM, the impact of his innovations is sure to resonate throughout the industry for years to come.

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