Tring, United Kingdom

Andrew Robert Ray

This inventor holds 1 USPTO granted patent. Top assignee: Nikon Metrology Nv. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Andrew Robert Ray. Retrieved from https://idiyas.com/inventor/andrew-robert-ray

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: The Innovations of Andrew Robert Ray

Introduction

Andrew Robert Ray is a notable inventor based in Tring, GB. He has made significant contributions to the field of computed radiographic tomography. His work focuses on enhancing the accuracy and efficiency of imaging technologies.

Latest Patents

Andrew Robert Ray holds a patent for a "Registration object, correction method and apparatus for computed radiographic tomography." This invention discloses a registration object designed for computed radiographic tomography. The object features a body portion that defines a void for including at least part of a target object. It comprises one or more relatively radiopaque or relatively radiolucent features. These features provide identifiable registration points in radiographic projections, which are essential for accurate imaging.

Career Highlights

Andrew Robert Ray is currently associated with Nikon Metrology NV, where he applies his expertise in imaging technologies. His work at Nikon Metrology NV has allowed him to contribute to advancements in the field of metrology and imaging.

Collaborations

Andrew Robert Ray collaborates with Andrew Timothy Ramsey, enhancing the innovative capabilities within their projects.

Conclusion

Andrew Robert Ray's contributions to computed radiographic tomography exemplify the impact of innovation in imaging technologies. His patent and work at Nikon Metrology NV highlight his commitment to advancing the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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