This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: X-Ray Optical Systems Incorporated. Active years: 2019.
Company Filing History:
Years Active: 2019
Title: The Innovative Contributions of Andrew Hider
Introduction
Andrew Hider is a notable inventor based in Saratoga Springs, NY (US). He has made significant contributions to the field of material analysis through his innovative patent. His work focuses on enhancing the measurement capabilities of analytes in liquid samples, particularly in low concentration scenarios.
Latest Patents
Andrew Hider holds a patent titled "Active, variable sample concentration method and apparatus for sub-ppb measurements and exemplary X-ray analysis applications thereof." This patent describes a sample handling apparatus that allows for active, variable concentration of a sample. By introducing a measurement marker into the sample, Hider's method enables the concentration of analytes in a measurable way, even at lower levels. This technique facilitates higher-level measurements that can be extrapolated to determine the original concentrations of the analytes.
Career Highlights
Hider is currently employed at X-Ray Optical Systems Incorporated, where he applies his expertise in material analysis. His innovative approach has positioned him as a key figure in the development of advanced measurement techniques. His work is crucial for applications that require precise analysis of low-level substances.
Collaborations
Andrew Hider collaborates with talented individuals such as Zewu Chen and Danhong Li. Their combined efforts contribute to the advancement of technology in the field of X-ray analysis and material measurement.
Conclusion
Andrew Hider's contributions to the field of material analysis through his innovative patent demonstrate his commitment to advancing measurement techniques. His work not only enhances the capabilities of analyzers but also paves the way for future innovations in the industry.