The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2019
Filed:
May. 29, 2015
X-ray Optical Systems, Inc., East Greenbush, NY (US);
Zewu Chen, Schenectady, NY (US);
George Allen, Middle Grove, NY (US);
Andrew Hider, Saratoga Springs, NY (US);
Danhong Li, Latham, NY (US);
Jon Dunphy, East Greenbush, NY (US);
Joseph Spinazola, Medway, MA (US);
X-RAY OPTICAL SYSTEMS, INC., East Greenbush, NY (US);
Abstract
A sample handling apparatus/technique/method for a material analyzer, which provides active, variable concentration of a sample, using a measurement marker introduced into the sample, to measurably concentrate an analyte in a liquid (e.g., water) sample. Active, variable concentration allows otherwise lower level analytes to be concentrated in a measurable way. This enables measurements at higher (e.g., concentrated) levels, which can be extrapolated to obtain their lower, original levels based on the concentration level—measured using the introduced marker as a guide. The sample handling apparatus may be used in combination with an optic-enabled x-ray analyzer, the x-ray analyzer including an x-ray engine with an x-ray excitation path and an x-ray detection path, usable during both during the concentration and analyte measurement.