Company Filing History:
Years Active: 2019
Title: Jon Dunphy: Innovator in Sample Concentration Technology
Introduction
Jon Dunphy is a notable inventor based in East Greenbush, NY (US). He has made significant contributions to the field of material analysis through his innovative patent. His work focuses on enhancing the measurement capabilities of analytes in liquid samples.
Latest Patents
Jon Dunphy holds a patent for an "Active, variable sample concentration method and apparatus for sub-ppb measurements and exemplary X-ray analysis applications thereof." This invention provides a sample handling apparatus and technique that allows for active, variable concentration of a sample. By introducing a measurement marker into the sample, it enables the concentration of analytes in liquid samples, such as water. This method allows for the measurement of lower-level analytes by concentrating them to measurable levels, which can then be extrapolated to determine their original concentrations.
Career Highlights
Jon Dunphy is associated with X-ray Optical Systems Incorporated, where he applies his expertise in sample analysis. His innovative approach has the potential to revolutionize how materials are analyzed, particularly in applications requiring precise measurements of low-level analytes.
Collaborations
Jon collaborates with talented individuals such as Zewu Chen and George Allen, contributing to advancements in their field through teamwork and shared expertise.
Conclusion
Jon Dunphy's work in developing a method for active, variable sample concentration showcases his innovative spirit and dedication to improving material analysis techniques. His contributions are paving the way for more accurate measurements in various applications.