This inventor holds 1 USPTO granted patent. Top assignee: Teradyne, Inc.. Active years: 2003.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2003
Title: Andrew Damian Firth: Innovator in Semiconductor Testing Technology
Introduction
Andrew Damian Firth is a notable inventor based in Portland, OR (US). He has made significant contributions to the field of semiconductor testing technology. His innovative work has led to the development of a patented technology that enhances the efficiency of testing semiconductor devices.
Latest Patents
Andrew holds a patent for an "ATE timing measurement unit and method." This automatic test equipment is designed for testing semiconductor devices and includes a computer workstation along with pin electronics circuitry. The pin electronics circuitry features multiple channels, each equipped with timing circuitry that responds to programmed timing information. The driver/comparator circuitry is coupled to the timing circuitry, enabling it to drive test waveforms at a specified period and sample data from these waveforms. The timing measurement unit measures the relative timings of the sampled data, allowing for the production of real-time timing measurement data in parallel.
Career Highlights
Andrew is currently employed at Teradyne, Inc., where he continues to innovate in the field of semiconductor testing. His work has been instrumental in advancing the capabilities of automatic test equipment, making it more efficient and effective for testing purposes.
Collaborations
Andrew has collaborated with notable colleagues, including Benjamin J. Brown and Erik V. Hultine. These collaborations have contributed to the development of advanced technologies in the semiconductor testing industry.
Conclusion
Andrew Damian Firth is a distinguished inventor whose work in semiconductor testing technology has made a significant impact. His patented innovations continue to shape the future of automatic test equipment, demonstrating his commitment to advancing technology in this critical field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
