Andrew C Lang

Title: Andrew C Lang: Innovator in Reliability Testing

Introduction

Andrew C Lang is a notable inventor based in Branchburg, NJ (US). He has made significant contributions to the field of reliability testing, particularly in the context of coupled device structures. His innovative approach has led to advancements in the methods used to assess the reliability of layered devices at a micron-scale.

Latest Patents

Andrew C Lang holds a patent for an "Accelerated failure test of coupled device structures under direct current bias." This patent describes a method for conducting an in situ reliability test on a cross-section of a device with a layered structure at a micron-scale and at least two electrodes. The method involves locating an electron transparent cross-sectional portion of the device in a holder, transmitting a direct current bias voltage to this portion through the electrodes, and observing the microstructural changes of the device cross-section. This innovative system enhances the reliability testing of devices with complex structures.

Career Highlights

Andrew C Lang is affiliated with Drexel University, where he continues to contribute to research and development in his field. His work focuses on improving the reliability of electronic devices, which is crucial for their performance and longevity. With a patent portfolio that includes 1 patent, he has established himself as a key figure in the realm of device reliability.

Collaborations

Andrew has collaborated with notable colleagues, including Mitra Lenore Taheri and Hessam Ghassemi. These partnerships have fostered a collaborative environment that enhances research outcomes and innovation in reliability testing.

Conclusion

Andrew C Lang's contributions to the field of reliability testing are significant and impactful. His innovative methods and collaborative efforts continue to advance the understanding and assessment of device reliability.