Hagnau, Germany

Andreas Ecker

This inventor holds 1 USPTO granted patent. Top assignee: The United States of America as Represented by the Administrator of the. Active years: 1989.


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 1989

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1 patent (USPTO):Explore Patents

Title: Innovations of Andreas Ecker in Holographic Interferometry

Introduction

Andreas Ecker is a notable inventor based in Hagnau, Germany. He has made significant contributions to the field of holographic interferometry, particularly with his innovative approach to measuring parameters such as temperature gradients. His work exemplifies the intersection of technology and practical applications in scientific measurement.

Latest Patents

Ecker holds a patent for a "Dual wavelength holographic interferometry system and method." This invention relates to a two-wave holographic interferometry system where a reference beam holographic is superimposed on an object beam. The object beam is an image obtained by passing a beam through an object regarding which some parameter is to be measured. The invention employs two object beams and two reference beams, utilizing a prism assembly that causes the two different wavelengths of the object beams to emerge at slightly different angles. This results in two holographic images that are slightly displaced from each other, enhancing measurement accuracy.

Career Highlights

Throughout his career, Andreas Ecker has demonstrated a commitment to advancing the field of holographic technology. His innovative methods have paved the way for more precise measurements in various scientific applications. Ecker's work is recognized for its practical implications and contributions to the understanding of holographic systems.

Collaborations

Ecker has collaborated with William K Witherow, further enhancing the development and application of his inventions. Their partnership has contributed to the refinement of holographic techniques and methodologies.

Conclusion

Andreas Ecker's contributions to holographic interferometry highlight the importance of innovation in scientific measurement. His patent for a dual wavelength holographic interferometry system showcases his expertise and commitment to advancing technology in this field.

Profile summary based on public USPTO records.
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