The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 1989

Filed:

Jan. 29, 1988
Applicant:
Inventors:

William K Witherow, Huntsville, AL (US);

Andreas Ecker, Hagnau, DE;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356347 ; 356361 ;
Abstract

The present invention relates to a two-wave holographic interferometry system and method. In such systems, a reference beam holographic is super-imposed on an object beam, the object beam being an image obtained by passing a beam through an object regarding which some parameter (e.g. temperature gradient) is to be measured. A photograph (50) of the superimposed beams (D) is taken. The present invention employs two object (B) and two reference (A) beams and the invention is particularly concerned with the use of a prism assembly (C) which causes the two different wavelengths (W1, W2) of the object beams to emerge from the prism at slightly different angles, thereby providing two holographic images which are slightly displaced from each other.


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