Andreas Berghaus

Title: Innovations of Andreas Berghaus

Introduction

Andreas Berghaus is a notable inventor based in San Francisco, CA. He has made significant contributions to the field of atomic force microscopy through his innovative patents. With a total of 2 patents, Berghaus has demonstrated his expertise and creativity in developing advanced technologies.

Latest Patents

One of his latest patents is titled "Wear coating applied to an atomic force probe tip." This invention involves a probe tip manufactured from a conically shaped quartz tip etched to a fine apex. The quartz tip is coated with approximately 1 µm of a hard material such as silicon nitride. A probe tip with dimensions of about 100 nm × 1 µm is then machined from the hard material adjacent to the apex of the quartz tip using focused ion beam milling.

Another significant patent is "Interpolated height determination in an atomic force microscope." This method and apparatus enhance the accuracy of measuring the height of microscopic features in a substrate, particularly those with sloping faces. The probe tip is positioned at various vertical positions approaching the surface being probed. At each position, the vertical force encountered by the probe tip is measured and stored in memory along with its corresponding vertical position. When the measured force exceeds a threshold, the downward movement is halted, and the accumulated data is analyzed. A controller fits the data to two curves, allowing for precise height determination of the surface features.

Career Highlights

Throughout his career, Berghaus has worked with reputable companies such as FEI Company and Surface/interface, Inc. His experience in these organizations has contributed to his development as an inventor and innovator in the field of microscopy.

Collaborations

Some of his notable coworkers include Thomas Owen Mitchell and Charles E. Bryson, III. Their collaboration has likely fostered an environment of innovation and creativity, leading to advancements in their respective fields.

Conclusion

Andreas Berghaus is a distinguished inventor whose work in atomic force microscopy has led to significant advancements in the field. His innovative patents and collaborations with industry professionals highlight his contributions to technology and research.