This inventor holds 4 USPTO granted patents and 2 published patent applications and 2 EPO patents. Top assignee: Hach Lange Gmbh. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Andrè Naggies and Photometric Process Measurement
Introduction
Andrè Naggies is an inventor based in Berlin, Germany, whose patent work focuses on photometric process measurement. He is associated with Hach Lange GmbH and has 4 patents.
Latest Patents
Naggies’s latest patent work describes photometric measurement arrangements that use an immersion probe, a pulsed light source, wavelength-selective detectors, and electronic controls to measure process conditions.
One invention synchronizes readings from multiple detector channels. Its control system integrates the electrical signals produced by the detectors and triggers the analog-to-digital converters together once the first integrator reaches a stored target voltage. This approach coordinates measurements across the channels.
Another invention adapts the number of light impulses integrated during each measurement cycle to the intensity of the detector signals. It also manages the timing of the light source, including pauses between cycles, to keep the total number of impulses within a time frame substantially constant. These features combine signal measurement with thermal management.
Career Highlights
Naggies’s listed inventions address precision, synchronization, and operating stability in photometric instruments. His work brings together optical components, signal integration, conversion electronics, and control of pulsed illumination.
Collaborations
Naggies is associated with Hach Lange GmbH. Robert Dalljo is identified as a coworker.
Conclusion
Andrè Naggies’s patent work centers on improving photometric process measurement through coordinated detector readings, adaptive signal integration, and controlled light impulses.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
