Berlin, Germany

André Dziurla

This inventor holds 1 USPTO granted patent. Top assignees: Bruker Nano Gmbh, General Electric Company. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: André Dziurla. Retrieved from https://idiyas.com/inventor/andré-dziurla

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 17.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: André Dziurla: Innovator in Inspection Technology

Introduction

André Dziurla is a notable inventor based in Berlin, Germany. He has made significant contributions to the field of inspection technology, particularly through his innovative patent. His work has implications for various industries that require precise component inspection.

Latest Patents

Dziurla holds a patent for an "Inspection apparatus and method for inspecting a component." This apparatus includes a robotic arm and a micro-XRF instrument with an instrument head that is coupled to the robotic arm. The design features a seat that supports the component within a scanning area during inspection, along with a computer that communicates with both the robotic arm and the micro-XRF instrument. This invention enhances the efficiency and accuracy of component inspections.

Career Highlights

Throughout his career, Dziurla has worked with prominent companies such as General Electric Company and Bruker Nano GmbH. His experience in these organizations has allowed him to develop and refine his skills in inspection technology, contributing to his innovative approach.

Collaborations

Dziurla has collaborated with notable professionals in his field, including Gregory Donald Crim and Sven Martin Joachim Larisch. These collaborations have likely enriched his work and expanded the impact of his inventions.

Conclusion

André Dziurla is a distinguished inventor whose work in inspection technology has led to significant advancements in the field. His innovative patent and experience with leading companies underscore his contributions to the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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