Allen, TX, United States of America

Amit P Vasavada

This inventor holds 1 USPTO granted patent. Top assignee: Texas Instruments Corporation. Active years: 2011.


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: Innovations by Amit P Vasavada

Introduction

Amit P Vasavada is an accomplished inventor based in Allen, TX (US). He has made significant contributions to the field of integrated circuits, showcasing his expertise through his innovative patents. His work is particularly focused on enhancing the design and testing processes of integrated circuits.

Latest Patents

Amit holds a patent titled "System and method for estimating test escapes in integrated circuits." This patent presents a method for designing an integrated circuit that includes estimating a test escape rate for tests of interest. The invention features a test coverage calculator and a system for estimating a test escape rate associated with a portion of an integrated circuit (IC) die. In one embodiment, the method involves estimating a test escape rate for a set of fault tests based on an estimated yield and a combined coverage of the set of fault tests, accounting for overlapping coverage among the tests. Amit has 1 patent to his name.

Career Highlights

Amit is currently employed at Texas Instruments Corporation, a leading company in the semiconductor industry. His role involves applying his innovative methods to improve the design and testing of integrated circuits, contributing to the company's reputation for excellence in technology.

Collaborations

Amit has worked alongside talented colleagues such as Jayashree Saxena and Kenneth Michael Butler. Their collaborative efforts have further advanced the development of innovative solutions in the field of integrated circuits.

Conclusion

Amit P Vasavada is a notable inventor whose work in integrated circuits has led to valuable advancements in the industry. His patent on estimating test escapes demonstrates his commitment to innovation and excellence in technology.

Profile summary based on public USPTO records.
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