The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2011
Filed:
Feb. 15, 2008
Kenneth M. Butler, Richardson, TX (US);
John M. Carulli, Jr., Richardson, TX (US);
Jayashree Saxena, Richardson, TX (US);
Amit P. Vasavada, Allen, TX (US);
Kenneth M. Butler, Richardson, TX (US);
John M. Carulli, Jr., Richardson, TX (US);
Jayashree Saxena, Richardson, TX (US);
Amit P. Vasavada, Allen, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
A method for designing an integrated circuit including estimating a test escape rate for tests of interest, a test coverage calculator and a system for estimating a test escape rate for tests of interest associated with a portion of an integrated circuit (IC) die. In one embodiment the method includes the step of: estimating a test escape rate for a set of fault tests to be performed on an IC under design based on an estimated yield and a combined coverage of the set of fault tests; the combined coverage accounting for overlapping coverage among the set of fault tests.