Haifa, Israel

Amir Wachs


Average Co-Inventor Count = 3.2

ph-index = 4

Forward Citations = 70(Granted Patents)


Company Filing History:


Years Active: 2001-2005

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4 patents (USPTO):Explore Patents

Title: Amir Wachs: Innovator in Particle Removal Technology

Introduction

Amir Wachs is a notable inventor based in Haifa, Israel. He has made significant contributions to the field of particle removal technology, holding a total of 4 patents. His innovative approaches have garnered attention in various industries, particularly in semiconductor manufacturing.

Latest Patents

One of Amir Wachs' latest patents is an in situ module for particle removal from solid-state surfaces. This apparatus and method involve determining the respective position coordinates of particles on a substrate's surface. A beam of electromagnetic energy is directed via an optical cleaning arm at the coordinates of each particle in turn. The absorption of electromagnetic energy at the surface causes the particles to be dislodged without damaging the surface itself. This technology represents a significant advancement in maintaining the integrity of sensitive surfaces during cleaning processes.

Career Highlights

Throughout his career, Amir Wachs has worked with prominent companies in the semiconductor industry. He has been associated with Applied Materials, Inc. and Oramir Semiconductor Equipment Ltd. His experience in these organizations has allowed him to refine his expertise in particle removal technologies and contribute to innovative solutions in the field.

Collaborations

Amir has collaborated with several professionals in his field, including David Yogev and Yoram Uziel. These collaborations have fostered a creative environment that has led to the development of cutting-edge technologies.

Conclusion

Amir Wachs is a distinguished inventor whose work in particle removal technology has made a significant impact on the semiconductor industry. His innovative patents and collaborations highlight his commitment to advancing technology in this critical field.

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