Amir Komem

Title: Amir Komem: Innovator in Optical Inspection Technologies

Introduction

Amir Komem is a prominent inventor based in Tel Aviv, Israel. He has made significant contributions to the field of optical inspection, holding a total of 6 patents. His innovative methods and apparatuses have advanced the capabilities of optical inspection technologies.

Latest Patents

Among his latest patents, Amir has developed an "Optical inspection method and apparatus utilizing a collection angle design." This invention presents a method for optical inspection of a patterned article by illuminating a region with incident light. The light returned from the illuminated region is analyzed to determine the intensity distribution of scattered light components. This method allows for the collection of light components propagating within a predetermined solid angle segment, which are then directed to a dark-field detection unit.

Another notable patent is the "Optical inspection method and apparatus utilizing a variable angle design." This apparatus includes an illumination unit that generates an incident beam directed onto a specific region of the article. The detection unit collects light scattered from the illuminated region using a variable angle design, allowing for selective detection of light components.

Career Highlights

Amir Komem has worked with several notable companies throughout his career, including Applied Materials, Inc. and Scitex Inc. His experience in these organizations has contributed to his expertise in optical inspection technologies.

Collaborations

Amir has collaborated with several professionals in his field, including Serge Steinblatt and Ilan Ben Oren. These collaborations have further enriched his work and innovations.

Conclusion

Amir Komem is a distinguished inventor whose work in optical inspection has led to significant advancements in the field. His patents reflect a commitment to innovation and excellence in technology.