Amir A Moshar

Title: Amir A Moshar: Innovator in Scanning Capacitance Microscopy

Introduction

Amir A Moshar is a notable inventor based in Oxford, GB. He has made significant contributions to the field of microscopy, particularly through his innovative patent related to scanning capacitance microscopy and spectroscopy. His work has implications for various scientific and industrial applications.

Latest Patents

Amir A Moshar holds a patent for an "Apparatus and method for scanning capacitance microscopy and spectroscopy." This invention describes a technique for measuring the electrical capacitance between a conducting tip of a scanning probe microscope and a sample surface. The apparatus utilizes a high-frequency digital vector network analyzer connected to the probe tip of the cantilever of an atomic force microscope. Data collection is coordinated by a digital computer using digital trigger signals between the AFM controller and the vector network analyzer. The patent outlines methods for imaging tip-sample capacitance and conducting spectroscopic measurements at a single point on the sample, along with a method for system calibration.

Career Highlights

Amir A Moshar is associated with Asylum Research Corporation, where he has been instrumental in advancing the technology related to scanning probe microscopy. His expertise in the field has led to the development of innovative solutions that enhance the capabilities of microscopy techniques.

Collaborations

Throughout his career, Amir has collaborated with notable colleagues, including Maarten Rutgers and William H Hertzog. These collaborations have contributed to the advancement of research and development in the field of microscopy.

Conclusion

Amir A Moshar is a distinguished inventor whose work in scanning capacitance microscopy has paved the way for new methodologies in the field. His contributions continue to influence scientific research and technological advancements.