Sunnyvale, CA, United States of America

Alvin Jee

This inventor holds 1 USPTO granted patent. Top assignee: Heuristics Physics Laboratories, Inc.. Active years: 2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Alvin Jee. Retrieved from https://idiyas.com/inventor/alvin-jee-pbm3pdu0

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 2005

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Alvin Jee

Introduction

Alvin Jee is a notable inventor based in Sunnyvale, CA. He has made significant contributions to the field of technology, particularly in the area of fault detection in devices. His innovative approach has led to the development of a unique patent that addresses device failures.

Latest Patents

Alvin Jee holds a patent titled "Method and apparatus for determining fault sources for device failures." This patent outlines a method for identifying fault sources by generating failure signatures and comparing them with device test data. The process involves creating aggregate failure signatures and matches to determine the root causes of device failures. This invention is crucial for enhancing the reliability of electronic devices.

Career Highlights

Alvin Jee is currently employed at Heuristics Physics Laboratories, Inc., where he applies his expertise in fault detection and device reliability. His work has been instrumental in advancing the company's technological capabilities. With a focus on innovation, he continues to push the boundaries of what is possible in his field.

Collaborations

Alvin collaborates with talented individuals such as Arman Sagatelian and Julie D Segal. Their combined efforts contribute to the success of their projects and the advancement of technology at their workplace.

Conclusion

Alvin Jee's contributions to the field of technology through his patent and collaborative efforts highlight his innovative spirit. His work in determining fault sources for device failures is a testament to his dedication to improving device reliability.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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