The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2005
Filed:
Jan. 22, 2002
Arman Sagatelian, Sunnyvale, CA (US);
Alvin Jee, Sunnyvale, CA (US);
Julie Segal, Palo Alto, CA (US);
Yervant D. Lepejian, Palo Alto, CA (US);
John M. Caywood, Sunnyvale, CA (US);
Arman Sagatelian, Sunnyvale, CA (US);
Alvin Jee, Sunnyvale, CA (US);
Julie Segal, Palo Alto, CA (US);
Yervant D. Lepejian, Palo Alto, CA (US);
John M. Caywood, Sunnyvale, CA (US);
Heuristics Physics Laboratories, Inc., San Jose, CA (US);
Abstract
A method for determining fault sources for device failures comprises: generating failure signatures of fault sources for preselected tests; generating aggregate failure signatures for individual of the fault sources from the failure signatures; generating aggregate device test data from test data of a device for the preselected tests; generating aggregate matches by comparing the aggregate failure signatures with the aggregate device test data; and determining fault sources for device failures by comparing the test data of the device with ones of the failure signatures of fault sources corresponding to the aggregate matches. An apparatus configured to perform the method comprises at least one circuit.