Company Filing History:
Years Active: 1993-2002
Title: Alon Shacham: Innovator in Integrated Circuit Testing
Introduction
Alon Shacham is a prominent inventor based in Tel Aviv, Israel. He has made significant contributions to the field of integrated circuits, particularly in the area of testability architecture. With a total of 5 patents to his name, Shacham's work has had a substantial impact on the efficiency and cost-effectiveness of testing integrated circuits.
Latest Patents
One of Alon Shacham's latest patents is titled "Testability architecture for modularized integrated circuits." This invention presents a testability architecture and method for loosely integrated (modularized) integrated circuits that utilize stand-alone module testing. The architecture is designed for integrated circuit chips that contain multiple independent modules, where a single module design can be employed across various chips. Each module connects to the chip's input/output pins and a configuration module. This innovative approach allows for more efficient and cost-effective testing, as each module design is subjected to a consistent testing environment, regardless of the specific chip. Notably, the test circuitry only slightly increases the chip area. The configuration module's test architecture includes test registers and implements a standard protocol for all read and write transactions during testing. This method enhances test coverage and reduces the complexity of test generation.
Career Highlights
Alon Shacham is currently employed at National Semiconductor Corporation, where he continues to develop innovative solutions in the field of integrated circuits. His work has been instrumental in advancing the technology used in modern electronics.
Collaborations
Throughout his career, Alon has collaborated with notable colleagues, including Rami Saban and Avner Efendovich. These partnerships have contributed to the successful development of his patented technologies.
Conclusion
Alon Shacham's contributions to the field of integrated circuits, particularly in testability architecture, demonstrate his innovative spirit and commitment to advancing technology. His work continues to influence the efficiency of testing processes in the electronics industry.