Allen Joseph Langlois

Title: Allen Joseph Langlois: Innovator in Manufacturing Technology

Introduction

Allen Joseph Langlois is an accomplished inventor based in Apex, North Carolina, with a notable portfolio that includes three patents. His work focuses on advanced manufacturing technologies aimed at enhancing object detection and image analysis processes through innovative computing systems.

Latest Patents

Langlois's latest patents reflect his expertise and contributions to the field. One of his significant inventions is the "Manufacturing Defective Object Detection System." This sophisticated computing system identifies defective objects on a manufacturing line using a trained neural network model. It analyzes images of the manufacturing process, classifying each pixel as either background, non-defective, or defective, thereby grouping the classified pixels into defined polygons based on their characteristics.

Another noteworthy patent is the "Flexible Computer Architecture for Performing Digital Image Analysis." This architecture features a distributed messaging platform to receive and store images from cameras, applying an image analysis model to produce results that are further processed and analyzed. The system is designed to enhance efficiency, providing alerts based on the analysis outcomes.

Career Highlights

Allen Joseph Langlois is a dedicated inventor working for SAS Institute Inc., a leader in analytics and data management. His role involves applying his inventive skills to develop systems that improve operational efficiencies in manufacturing and image analysis.

Collaborations

Throughout his career, Langlois has collaborated with talented colleagues, including Jonathan Lee Walker and Varunraj Valsaraj. Together, they contribute to innovative projects that push the boundaries of technology and manufacturing processes.

Conclusion

Allen Joseph Langlois exemplifies the pioneering spirit of today's inventors, leveraging his expertise to create impactful technologies. His contributions to manufacturing defect detection and digital image analysis are a testament to his innovative mindset and dedication to advancing the field.