The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2023
Filed:
Apr. 04, 2023
Sas Institute Inc., Cary, NC (US);
Kedar Shriram Prabhudesai, Charlottesville, VA (US);
Jonathan Lee Walker, Raleigh, NC (US);
Sanjeev Shyam Heda, Kennesaw, GA (US);
Varunraj Valsaraj, Cary, NC (US);
Allen Joseph Langlois, Apex, NC (US);
Frederic Combaneyre, Sainte-Colombe-Pres-Vernon, FR;
Hamza Mustafa Ghadyali, Apex, NC (US);
Nabaruna Karmakar, Morrisville, NC (US);
SAS Institute Inc., Cary, NC (US);
Abstract
A computing system detects a defective object. An image is received of a manufacturing line that includes objects in a process of being manufactured. Each pixel included in the image is classified as a background pixel class, a non-defective object class, or a defective object class using a trained neural network model. The pixels included in the image that were classified as the non-defective object class or the defective object class are grouped into polygons. Each polygon is defined by a contiguous group of pixels classified as the non-defective object class or the defective object class. Each polygon is classified in the non-defective object class or in the defective object class based on a number of pixels included in a respective polygon that are classified in the non-defective object class relative to a number of pixels included in the respective polygon that are classified in the defective object class.