Fontenay Le Fleury, France

Ali Ibrahim

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Université Gustave Eiffel. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ali Ibrahim. Retrieved from https://idiyas.com/inventor/ali-ibrahim-936pyi5e

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Ali Ibrahim and Semiconductor Component Health Monitoring.

Introduction

Ali Ibrahim is an inventor associated with Université Gustave Eiffel in Fontenay-le-Fleury, France. His work includes a patented method for assessing the health of semiconductor-based power electronics by tracking changes in electrical current over time.

Latest Patents

Ibrahim is credited with 1 patent: “Method and device for measuring the state of health of semiconductor-based electronic components.” The method records a baseline current at an initial time when the component is at a specified voltage. It then measures current at later times under the same voltage condition. A processor uses the change between the baseline and later current values to calculate a quantitative indicator of component degradation.

Career Highlights

The patent addresses condition monitoring for semiconductor-based power electronics. By comparing measurements taken under a consistent voltage condition, the method provides a way to quantify changes in a component’s state of health.

Collaborations

Ibrahim’s listed coworkers include Richard Lallemand and Zoubir Khatir. His work is associated with Université Gustave Eiffel.

Conclusion

Ali Ibrahim’s patent presents a measurement-based approach to monitoring degradation in semiconductor power electronics, reflecting his contribution to component health assessment.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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