This inventor holds 2 USPTO granted patents. Top assignee: Fei Comapny. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Innovations of Ali Gheidari in Charged Particle Microscopy
Introduction
Ali Gheidari is a notable inventor based in Best, Netherlands. He has made significant contributions to the field of charged particle microscopy, holding 2 patents that showcase his innovative approach to aberration correction systems.
Latest Patents
Gheidari's latest patents include "Aberration correction systems and charged particle microscope systems including the same." This invention describes an apparatus that features a charged particle source and an optical column. The optical column is equipped with a multipole condenser that contains one or more condenser quadrupole-generating elements and/or a multipole objective with multiple objective multipole elements. These elements are designed to partially correct spherical aberration in a charged particle beam. The configuration allows the charged particle beam to enter the multipole objective with a non-circular beam profile, enhancing the performance of the system.
Another significant patent is "Multipole elements and charged particle microscope systems including the same." This invention outlines an apparatus that consists of a plurality of electrodes, categorized into first and second shape subsets. Each electrode in the first subset has a unique active surface shape compared to those in the second subset. This design aims to improve the functionality and efficiency of charged particle microscopes.
Career Highlights
Ali Gheidari is currently employed at FEI Company, where he continues to develop cutting-edge technologies in microscopy. His work has positioned him as a key figure in advancing the capabilities of charged particle imaging systems.
Collaborations
Gheidari collaborates with talented individuals such as Alexander Henstra and Galen Gledhill, contributing to a dynamic research environment that fosters innovation.
Conclusion
Ali Gheidari's contributions to charged particle microscopy through his patents and collaborative efforts highlight his role as a leading inventor in this specialized field. His work continues to influence advancements in microscopy technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile