This inventor holds 1 USPTO granted patent. Top assignees: Leibniz-Institut Fur Polymerforschung Dresden E.v., Plastic Logic Limited. Active years: 2015.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:

Years Active: 2015
Title: The Innovative Contributions of Alfredo Calvimontes
Introduction
Alfredo Calvimontes is a notable inventor based in Dresden, Germany. He has made significant contributions to the field of measurement technology, particularly in the area of surface topography measurement for coated reflective surfaces. His innovative approach has led to the development of a unique method and apparatus that enhances the accuracy of measurements in thin-layer technology.
Latest Patents
Calvimontes holds a patent for a "Method and apparatus for determining the surface topography of coated reflective surfaces." This invention addresses the need for precise measurement techniques in thin-layer technology, specifically for organic dielectric semi-conducting or conducting layers on substrates. The method utilizes chromatic white light measurement to determine the three-dimensional topography of the coating, followed by UV interferometry to measure the thickness of the coating. This dual approach allows for independent determination of both the surface topography of the coating and the underlying surface at the same position.
Career Highlights
Throughout his career, Alfredo Calvimontes has worked with esteemed organizations such as the Leibniz Institute for Polymer Research Dresden and Plastic Logic Limited. His experience in these institutions has contributed to his expertise in measurement technology and innovation.
Collaborations
Calvimontes has collaborated with various professionals in his field, including his coworker Kay Lederer. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and advancements in technology.
Conclusion
Alfredo Calvimontes is a distinguished inventor whose work in measurement technology has paved the way for advancements in the field. His innovative patent demonstrates his commitment to improving measurement techniques for coated reflective surfaces. His contributions continue to influence the industry and inspire future innovations.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile