This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignees: Développement Des Méthodes Et Processus Industriels, Safran/association Pour La Recherche Et Le. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: Alexiane Arnaud: Innovator in X-ray Imaging Technology
Introduction
Alexiane Arnaud is a notable inventor based in Moissy-Cramayel, France. She has made significant contributions to the field of x-ray imaging technology. Her innovative work has led to the development of a unique device and method for measuring angles of orientation in x-ray imaging systems.
Latest Patents
Alexiane Arnaud holds a patent for a "Device and method for measuring angles of orientation of an x-ray imaging system." This invention includes an x-ray source, an x-ray detector, and a sample holder designed to receive a sample for analysis. The method involves emitting a polychromatic x-ray beam through a reference sample to create a diffraction pattern on the x-ray detector's sensing area. By generating an observed image that includes this diffraction pattern, the orientation of both the x-ray source and detector can be determined by comparing it with a target image that has preset orientations.
Career Highlights
Throughout her career, Alexiane has worked with prominent companies such as Safran and the Association Pour La Recherche Et Le Développement Des Méthodes Et Processus Industriels. Her experience in these organizations has allowed her to refine her skills and contribute to advancements in industrial methods and processes.
Collaborations
Alexiane has collaborated with talented individuals such as Clément Remacha and Henry Proudhon. These partnerships have fostered innovation and have been instrumental in her research and development efforts.
Conclusion
Alexiane Arnaud is a pioneering inventor whose work in x-ray imaging technology has made a significant impact in her field. Her patent and collaborations reflect her dedication to advancing scientific knowledge and industrial applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile