Toronto, Canada

Alexandre Obotnine


Average Co-Inventor Count = 2.5

ph-index = 6

Forward Citations = 169(Granted Patents)


Location History:

  • Willowdale, CA (2002 - 2003)
  • Toronto, CA (2006 - 2014)

Company Filing History:


Years Active: 2002-2014

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7 patents (USPTO):Explore Patents

Title: Innovations of Alexandre Obotnine

Introduction

Alexandre Obotnine is a notable inventor based in Toronto, Canada. He has made significant contributions to the field of optical sensor technology, holding a total of seven patents. His work focuses on enhancing measurement and inspection apparatuses through innovative optical solutions.

Latest Patents

One of his latest patents is an optical sensor device designed for use in measuring and inspection apparatuses. This device includes an optical sensor head with a white light sensor that features a wideband radiation source, a wavelength-sensitive receiver, and beam-splitting means. Additionally, it incorporates an objective for directing a measuring beam onto an object and detecting the reflection beam. Another significant patent is for a method and apparatus for auto-focusing infinity corrected microscopes. This invention involves directing and converging light beams towards a specimen, forming images from the reflected light, and using calibration measurements to auto-focus the microscope.

Career Highlights

Throughout his career, Alexandre has worked with companies such as Photon Dynamics Canada Inc. and Photon Dynamics, Inc. His experience in these organizations has allowed him to develop and refine his innovative ideas in optical technology.

Collaborations

Alexandre has collaborated with notable individuals in his field, including Adam Weiss and Afsar Saranli. These partnerships have contributed to the advancement of his inventions and the successful implementation of his patents.

Conclusion

Alexandre Obotnine's contributions to optical sensor technology and his innovative patents highlight his role as a significant inventor in the field. His work continues to influence advancements in measurement and inspection technologies.

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