This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Micro-Epsilon Messtechnik Gmbh & Co. Kg. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: Alexander Zimmermann: Innovator in Optical Measurement Technology
Introduction
Alexander Zimmermann is a notable inventor based in Aholming, Germany. He has made significant contributions to the field of optical measurement technology. His innovative approach has led to the development of a unique method for measuring objects with reflective surfaces.
Latest Patents
Zimmermann holds a patent for a "Method and system for optically measuring an object having a specular and/or partially specular surface and corresponding measuring arrangement." This invention focuses on a method for optically measuring objects with reflective surfaces. The process involves generating a planar pattern that varies in at least one optical property, allowing for the distinction of multiple points or groups of points. The reflected pattern from the object's surface is captured by a camera unit, which converts it into a camera image. The correspondence function describes the relationship between points in the camera image and the original pattern, utilizing geometric properties of the reflective surface.
Career Highlights
Zimmermann is associated with Micro-Epsilon Messtechnik GmbH & Co. KG, a company known for its precision measurement technology. His work has been instrumental in advancing the capabilities of optical measurement systems.
Collaborations
He has collaborated with notable colleagues, including Reiner Kickingereder and Christian Faber, contributing to the development of innovative measurement solutions.
Conclusion
Alexander Zimmermann's contributions to optical measurement technology exemplify the impact of innovative thinking in engineering. His patent reflects a significant advancement in the field, showcasing his expertise and dedication to improving measurement techniques.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
