Method and system for optically measuring an object having a specular and/or partially specular surface and corresponding measuring arrangement

Abstract

The invention relates to a method for optically measuring an object having a reflective and/or partially reflective surface. According to the invention, by means of a pattern generator (), a planar pattern () is generated which is varied in at least one optical property such that, at least in partial regions (), a plurality of different points (p) or a plurality of different groups of points are distinguishable from each other. At least parts of the pattern () are reflected by a reflective surface () of the object () as a reflected pattern onto a detector () of a camera unit (), wherein the reflected pattern is converted by the detector () into a camera image (). A connection between points (q) of the camera image () and corresponding points (p) of the pattern () can be described by means of a correspondence function which is dependent on geometric properties of the reflective surface () of the object (). At least one of the geometric properties of the reflective surface () of the object () is determined by using differential geometric properties of a transformation given by the correspondence function. The invention furthermore relates to a corresponding system and a corresponding measuring arrangement.