Munich, Germany

Alexander Zimmer

This inventor holds 5 USPTO granted patents and 5 published patent applications. Top assignees: X-Fab Global Services Gmbh, X-Fab Semiconductor Foundries Gmbh. Active years: 2021-2026.

USPTO Granted Patents = 5 

% Patents Active = 100.0

Average Co-Inventor Count = 2.7

ph-index = 1


Location History:

  • Uhlstadt-Kirchhasel, DE (2021)
  • Rudolstadt, DE (2023)

Company Filing History:


Years Active: 2021-2026

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5 patents (USPTO):Explore Patents

Title: Innovations of Alexander Zimmer

Introduction

Alexander Zimmer is a notable inventor based in Munich, Germany. He has made significant contributions to the field of semiconductor technology. With a focus on imaging apparatus and breakdown voltage detection, his work has garnered attention in the industry.

Latest Patents

Zimmer holds 5 patents that showcase his innovative approach. His first patent is for a semiconductor imaging apparatus and method. This apparatus includes a light detection device in a silicon substrate, an optical filter to manage light incidence, an isolation structure to prevent charge carrier interference, and a photodiode for detection. His second patent involves a semiconductor structure designed to measure the breakdown voltage of a pn-junction, which is crucial for understanding semiconductor behavior.

Career Highlights

Alexander Zimmer is currently employed at X-Fab Global Services GmbH, where he continues to push the boundaries of semiconductor technology. His work is characterized by a commitment to advancing the capabilities of imaging systems and enhancing the reliability of semiconductor devices.

Collaborations

Zimmer collaborates with various professionals in his field, including his coworker Daniel Gäbler. Their combined expertise contributes to the innovative projects at X-Fab Global Services GmbH.

Conclusion

Alexander Zimmer's contributions to semiconductor technology through his patents and career at X-Fab Global Services GmbH highlight his role as a key innovator in the industry. His work continues to influence advancements in imaging and semiconductor reliability.

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