Alexander Shulman

Title: Alexander Shulman: Innovator in Wafer Orientation Technology

Introduction

Alexander Shulman is a notable inventor based in Rehovot, Israel. He has made significant contributions to the field of technology, particularly in the area of wafer orientation. His innovative approach has led to the development of a unique method that enhances the precision of determining the internal orientation of wafers.

Latest Patents

Shulman's most recent patent is titled "Method for determining the internal orientation of a wafer." This patent describes a method for determining the orientation of a pattern on the surface of an object relative to the object itself. The pattern consists of an array of generally perpendicular grid lines that intersect at grid junctions, while the object includes a marker located at its edge. The method involves several steps, including determining the directions of the grid lines and the object's orientation axis relative to a reference coordinate system. This innovative technique is crucial for improving the accuracy of wafer processing.

Career Highlights

Alexander Shulman is currently associated with Nova Measuring Instruments Ltd., a company known for its advanced measurement solutions in the semiconductor industry. His work at Nova has allowed him to apply his inventive skills to real-world applications, contributing to the company's reputation for innovation and excellence.

Collaborations

Shulman has collaborated with notable colleagues, including Ido Holcman and Jeffrey Danowitz. These partnerships have fostered a creative environment that encourages the exchange of ideas and the development of cutting-edge technologies.

Conclusion

In summary, Alexander Shulman is a distinguished inventor whose work in wafer orientation technology has made a significant impact in the field. His innovative methods and collaborations continue to drive advancements in semiconductor measurement solutions.