Alexander Graf

Title: Alexander Graf and Laser Scanner Field Correction.

Introduction

Alexander Graf is an inventor based in Bodenwoehr, Germany. His patent work concerns improving the accuracy of laser scanner systems through scanning-field correction.

Latest Patents

Graf is associated with 1 patent: “Method for Scanning Field Correction at Least of a Laser Scanner Device, Laser Scanner Device, Scatter Pattern Element, Scatter Pattern Holding Device and Scanning Field Correction System.”

The invention describes a method for calibrating a laser scanner’s deflection unit. A scatter-pattern element is placed on a processing plane, and the scanner’s laser beam scans at least part of it through a window, preferably protective glass. The system detects radiation scattered or reflected by the pattern and correlates those measurements with the scanner coordinates to create a contour diagram. By comparing that diagram with a reference image, the system determines deviations and calculates a calibration function for controlling the deflection unit.

Career Highlights

Graf’s listed patent addresses a practical calibration challenge: correcting scanning-field deviations while accounting for optical components between the scanner’s deflection unit and the processing plane. He is associated with Novanta Europe GmbH.

Collaborations

Florian Klemmer and Thomas Buckert are identified as Graf’s coworkers. The available information does not specify their roles in the patent or their contributions to the invention.

Conclusion

Alexander Graf’s patent focuses on using a scatter pattern and measured radiation to identify scanning-field deviations and improve laser scanner calibration.