This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Micro-Epsilon Messtechnik Gmbh & Co. Kg. Active years: 2012.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2012
Title: Alexander Fink: Innovator in Optical Measurement Technology
Introduction
Alexander Fink is a notable inventor based in Passau, Germany. He has made significant contributions to the field of optical measurement technology. His innovative approach focuses on enhancing the accuracy of measurement devices, particularly in challenging conditions.
Latest Patents
Fink holds a patent for a "Method for compensating for temperature related measurement errors in a confocal chromatic measuring distance sensor." This invention addresses the issue of temperature-induced measurement inaccuracies in optical arrangements. The method involves passing a multicolored beam through an optical arrangement, which is designed to minimize production costs while ensuring reliable compensation for temperature-related errors. The system utilizes a detector device to analyze the spectrum of the light beam, allowing for precise temperature determination and error compensation.
Career Highlights
Fink is currently employed at Micro-Epsilon Messtechnik GmbH & Co. KG, a company renowned for its advanced measurement technology solutions. His work at Micro-Epsilon has positioned him as a key player in the development of innovative measurement systems. Fink's expertise in optical technology has led to advancements that benefit various industries.
Collaborations
Fink collaborates with Reinhold Hoenicka, contributing to the development of cutting-edge measurement solutions. Their partnership has fostered innovation and enhanced the capabilities of the technologies they work on.
Conclusion
Alexander Fink's contributions to optical measurement technology exemplify the impact of innovative thinking in engineering. His patent and work at Micro-Epsilon demonstrate a commitment to improving measurement accuracy and reliability. Fink's efforts continue to shape the future of measurement technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
