The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2012
Filed:
May. 21, 2008
Reinhold Hoenicka, Ortenburg, DE;
Alexander Fink, Passau, DE;
Reinhold Hoenicka, Ortenburg, DE;
Alexander Fink, Passau, DE;
Micro-epsilon Messtechnik GmbH & Co. KG, Ortenburg, DE;
Abstract
According to the invention, a method for compensating for temperature related measurement errors in an optical arrangement, comprising at least one lens is designed with a view to an economical and reliable as possible compensation for temperature related measurement errors without significant increased production expense, wherein a multicolored beam is passed through the optical arrangement, which is focused at points at varying distances from the lens as a result of the chromatic aberration of the lens, at least a part of the spectrum of the light beam being at least partly reflected within the optical arrangement and directed to a detector device by means of which a determination of a spectrum is carried out, the temperature of the arrangement is determined from the spectrum recorded by the detection device and a compensation for temperature related measurement errors is carried out based on the temperature determined thus. A corresponding optical arrangement in disclosed.