Abingdon, United Kingdom

Alexander Drayton

This inventor holds 1 USPTO granted patent and 3 published patent applications. Top assignee: Snap Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Alexander Drayton. Retrieved from https://idiyas.com/inventor/alexander-drayton

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Alexander Drayton: Innovator in Thin Film Technology

Introduction

Alexander Drayton is a notable inventor based in Abingdon, GB. He has made significant contributions to the field of thin film technology, particularly with his innovative patent that addresses the complexities of non-uniform thicknesses in thin film layers.

Latest Patents

Drayton holds a patent for "Thin film layers having non-uniform thicknesses." This invention involves a thin film stack deposited on a substrate, where the first layer can have a non-uniform thickness. A second layer, positioned between the substrate and the first layer, can also exhibit non-uniform thickness. The patent details a process for forming patterns on these layers to create holes with varying depths, ultimately resulting in a plurality of diffractive elements of different sizes.

Career Highlights

Alexander Drayton is currently employed at Snap Inc., where he continues to push the boundaries of innovation in technology. His work has garnered attention for its potential applications in various industries, particularly in optics and materials science.

Collaborations

Drayton collaborates with talented individuals such as Parashara Panduranga and Marcell Kiss, contributing to a dynamic and innovative work environment.

Conclusion

Alexander Drayton's contributions to thin film technology exemplify the spirit of innovation. His patent on non-uniform thicknesses in thin film layers showcases his expertise and commitment to advancing technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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