Alexander Blum

Title: Alexander Blum: Innovator in Structured Light Metrology

Introduction

Alexander Blum is a notable inventor based in Livermore, California. He has made significant contributions to the field of structured light metrology, particularly through his innovative patent that addresses optimal parameter selection in scanning systems. His work is essential for enhancing the accuracy and efficiency of metrology applications.

Latest Patents

Alexander Blum holds a patent titled "Optimal parameter selection for structured light metrology." This patent discloses a method for selecting an optimal value for an adjustable parameter of a structured light metrology (SLM) system used for scanning objects. The SLM system performs test scans to acquire multiple sets of measurements, utilizing different parameter values for each scan. A quality metric is calculated for each test scan based on the measurements and simulation data. The method identifies a test scan that meets a specified optimization criterion, allowing for the selection of the optimal parameter value for future scans.

Career Highlights

Blum is currently employed at Lawrence Livermore National Security, LLC, where he applies his expertise in metrology and innovation. His work has contributed to advancements in the field, making significant impacts on how structured light systems operate.

Collaborations

Some of his notable coworkers include Brian Giera and Adam W Jaycox, who collaborate with him on various projects within the organization.

Conclusion

Alexander Blum's contributions to structured light metrology through his innovative patent demonstrate his commitment to advancing technology in this field. His work continues to influence the efficiency and accuracy of metrology systems.