Leuven, Belgium

Alex Van Den Bossche

This inventor holds 1 USPTO granted patent. Top assignee: Metris Ipr N.v.. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Alex Van Den Bossche. Retrieved from https://idiyas.com/inventor/alex-van-den-bossche-46mdwhc9

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 15(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Alex Van Den Bossche

Introduction

Alex Van Den Bossche is a notable inventor based in Leuven, Belgium. He has made significant contributions to the field of measurement technology. His work focuses on enhancing the accuracy and reliability of measuring devices.

Latest Patents

One of his key inventions is a method and device for the verification and identification of a measuring device. This invention addresses the need for precise measurement of spatial positions within a defined measuring volume. The patent outlines a process that involves calibrating the measuring device and using a reference object with predetermined dimensions. By determining the position of several points on this reference object, the invention allows for adjustments to be made based on deviations from actual dimensions. This innovative approach ensures that measuring devices provide accurate spatial data.

Career Highlights

Alex Van Den Bossche has been associated with Metris Ipr N.V., where he has applied his expertise in measurement technology. His work has contributed to advancements in the field, particularly in the calibration and verification of measuring devices. His patent portfolio, though modest with just one patent, reflects his commitment to innovation and quality in measurement solutions.

Collaborations

Due to space constraints, the collaborations section will be omitted.

Conclusion

Alex Van Den Bossche exemplifies the spirit of innovation in measurement technology. His contributions, particularly through his patent, highlight the importance of accuracy in spatial measurements. His work continues to influence the field and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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