The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2007
Filed:
Apr. 24, 2002
Alex Van Den Bossche, Leuven, BE;
Alex Van Den Bossche, Leuven, BE;
Metris IPR NV, Leuven, BE;
Abstract
The invention concerns a method and a reference object for the verification and identification of a measuring device for measuring the spatial position of one or several points situated in the measuring volume () of the measuring device, whereby the measuring device is calibrated, according to which calibration a mathematical model is calculated which makes it possible to determine the spatial position of a point perceived by the measuring device, whereby a reference object () with predetermined dimensions is provided in the measuring volume (), and, next, the position of several points of this reference object () is determined by means of the measuring device, whereby the mutual situation of the thus determined position of the points of the reference object () is calculated and compared to the actual dimensions of the reference object () and, on the basis of the thus established deviations between the measured mutual position of the points of the reference object () and the actual dimensions of the reference object (), said model is adjusted.