This inventor holds 1 USPTO granted patent. Top assignee: Kla Tencor Corporation. Active years: 2021.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2021
Title: Alex Teng Song Lim: Innovator in Die Screening Technology
Introduction
Alex Teng Song Lim is a notable inventor based in Singapore, SG. He has made significant contributions to the field of die screening technology. His innovative approach has led to the development of a patent that enhances the efficiency of defect classification in semiconductor manufacturing.
Latest Patents
Alex Teng Song Lim holds a patent titled "Die screening using inline defect information." This patent encompasses methods, systems, and apparatuses for die screening that utilize inline defect information. The process involves receiving a plurality of defects and wafersort electrical data for multiple dies. Each defect is classified as either a defect-of-interest or a nuisance. The invention also includes determining a defect-of-interest confidence for each defect and generating an inking map that is electronically communicated to an inking system. This technology leverages machine learning for defect classification, showcasing a modern approach to semiconductor quality control.
Career Highlights
Alex Teng Song Lim is currently employed at Kla Tencor Corporation, a leading company in the semiconductor industry. His work focuses on improving die screening processes, which are crucial for ensuring the reliability of semiconductor devices. His innovative contributions have positioned him as a key player in the field.
Collaborations
Alex collaborates with Ganesh Meenakshisundaram, a fellow professional in the industry. Their partnership enhances the development and implementation of advanced technologies in die screening.
Conclusion
Alex Teng Song Lim's contributions to die screening technology reflect his commitment to innovation in the semiconductor industry. His patent demonstrates a significant advancement in the classification of defects, which is essential for maintaining high-quality standards in semiconductor manufacturing.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
