La Jolla, CA, United States of America

Alex E Jvirblis

This inventor holds 1 USPTO granted patent. Top assignee: Diagnostic Instruments, Inc.. Active years: 1976.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Alex E Jvirblis. Retrieved from https://idiyas.com/inventor/alex-e-jvirblis

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 1976

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1 patent (USPTO):Explore Patents

Title: The Innovations of Alex E. Jvirblis

Introduction

Alex E. Jvirblis is a notable inventor based in La Jolla, California. He has made significant contributions to the field of image processing through his innovative patent. His work focuses on enhancing the optical density of images, which has applications in various industries.

Latest Patents

Alex E. Jvirblis holds a patent for a process known as image intensification. This process involves enhancing the optical density of images by forming an image on a shrinkable substrate defined by a plurality of particles. The innovative technique allows for the creation of a reduced-size image with substantially improved optical density by shrinking the substrate with the image thereon.

Career Highlights

Jvirblis is associated with Diagnostic Instruments, Inc., where he applies his expertise in image processing. His work has contributed to advancements in imaging technology, making it more effective and efficient.

Collaborations

Throughout his career, Alex has collaborated with notable colleagues, including Walter Roth and Murray Edmond Goodman. These partnerships have fostered innovation and development in their respective fields.

Conclusion

Alex E. Jvirblis is a distinguished inventor whose work in image intensification has made a lasting impact on imaging technology. His contributions continue to influence advancements in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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