Company Badge
USPTO Data Jan 1 1976 - Oct 27 2026
8 Patents
#18 in Sterling Heights, MI
#1,236 in Michigan
#35,954 in US
Diagnostic Instruments, Inc.
Forward Citations = 196
13 inventors:
Sterling Heights, MI, United States of America
Diagnostic Instruments, Inc.
Calculating rank
Forward Citations = 196
Loading Chart...
Loading Chart...
13 inventors (with patents filed for the assignee):
Philip T Merlo (2 out of 4 patents)
John Jacob Torongo (2 out of 4 patents)
Susan A Strenk (2 out of 2 patents)
4. Lawrence M Strenk (2 out of 2 patents)
5. Walter Roth (2 out of 2 patents)
6. Matthew Andrew Laise (1 out of 3 patents)
7. Patrick Aloysius Merlo (1 out of 3 patents)
8. Larry Michaels (1 out of 3 patents)
9. Murray Edmond Goodman (1 out of 35 patents)
10. Gerard McGoogan (1 out of 1 patent)
11. Reuben S Mezrich (1 out of 1 patent)
12. Stephen William McMahon (1 out of 1 patent)
13. Alex E Jvirblis (1 out of 1 patent)
8 patents:
Company Overview
Diagnostic Instruments, Inc. specializes in developing and manufacturing high-quality diagnostic instruments for medical facilities and research laboratories. With a focus on accuracy, precision, and reliability, our products help healthcare professionals make accurate diagnoses and deliver effective treatments to patients. Visit our website for more information on our wide range of diagnostic instruments.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Diagnostic Instruments, Inc.. Retrieved from https://idiyas.com/company/diagnostic-instruments
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]