Company Filing History:
Years Active: 2019-2021
Title: Alejandro S Jaime: Innovator in Wafer and Photomask Inspection Technologies
Introduction
Alejandro S Jaime is a notable inventor based in Hollister, CA (US). He has made significant contributions to the field of wafer and photomask inspection technologies. With a total of 2 patents to his name, Jaime continues to push the boundaries of innovation in his area of expertise.
Latest Patents
Jaime's latest patents focus on systems, devices, and methods for combined wafer and photomask inspection. These innovations provide advanced solutions for the semiconductor industry. In some embodiments, the patents describe chucks that include a removable insert designed to support a wafer. This configuration ensures that the examination surface of the wafer lies within a focal range when the chuck is in its first configuration. Additionally, the patents detail a structure that forms a recess deep enough to support a photomask, allowing its examination surface to also lie within the focal range when the chuck is in a second configuration.
Career Highlights
Alejandro S Jaime is currently employed at Nanotronics Imaging, Inc., where he applies his expertise in developing cutting-edge inspection technologies. His work has been instrumental in enhancing the efficiency and accuracy of semiconductor manufacturing processes.
Collaborations
Jaime collaborates with talented professionals in his field, including Randolph E Griffith and Jeff Andresen. These partnerships foster a creative environment that drives innovation and leads to the development of groundbreaking technologies.
Conclusion
Alejandro S Jaime is a prominent inventor whose work in wafer and photomask inspection technologies has made a significant impact on the semiconductor industry. His contributions continue to shape the future of this critical field.