San Jose, CA, United States of America

Albert J Crespin


Average Co-Inventor Count = 6.0

ph-index = 2

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2009-2011

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3 patents (USPTO):Explore Patents

Title: Innovations by Albert J. Crespin: A Look at His Contributions in Substrate Measurement Technology

Introduction

Albert J. Crespin, an accomplished inventor based in San Jose, California, has made significant contributions to the field of measurement technology. With a total of three patents to his name, Crespin has focused on innovations that enhance the precision and effectiveness of alignment processes in semiconductor manufacturing.

Latest Patents

One of Crespin's latest patents is titled "Dual-sided substrate measurement apparatus and methods." This innovative apparatus is designed to measure the relative positions of frontside and backside alignment marks located on opposite sides of a substrate. The technology incorporates upper and lower optical systems that enable simultaneous imaging of both alignment marks. The images generated are processed to accurately determine the relative positions of the marks, which is essential for assessing the alignment and overlay performance of the tools used in substrate production.

Career Highlights

Crespin's career at Ultratech, Inc. has been marked by his dedication to advancing measurement technologies. His expertise in optical systems and alignment methods has positioned him as a key figure in the development of cutting-edge solutions for the semiconductor industry. His work not only reflects his technical prowess but also his commitment to innovation in manufacturing processes.

Collaborations

Throughout his career, Crespin has had the opportunity to collaborate with talented professionals such as Jim Woodruff and Ray Ellis. Their joint efforts have contributed to the successful development of innovative solutions that address complex challenges in substrate measurement.

Conclusion

Albert J. Crespin stands out as a significant contributor to measurement technology, particularly in the semiconductor field. His patents and collaborative efforts at Ultratech, Inc. highlight his role in driving advancements that enhance manufacturing precision. As technology continues to evolve, Crespin's contributions will undoubtedly play a vital role in shaping the future of substrate measurement and alignment processes.

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