This inventor holds 1 USPTO granted patent. Top assignee: Intel Corporation. Active years: 1998.
Company Filing History:
Years Active: 1998
Title: Alan M Snyder: Innovator in Phase Metrology
Introduction
Alan M Snyder is a prominent inventor based in Sunnyvale, CA. He is known for his contributions to the field of phase metrology, particularly in the semiconductor industry. His innovative work has led to advancements that enhance the precision of optical measurements.
Latest Patents
Alan M Snyder holds a patent titled "Method and apparatus for precision determination of phase-shift in an attenuating phase metrology cell on a reticle comprising an attenuating feature and a binary feature." This patent describes a metrology cell used to determine the amount of focal shift associated with attenuating phase-shifting material. The process involves measuring the dimensions of an image of the attenuating feature at various focal distances from the reticle. Subsequently, relationships between these measurements and focal distances are established to determine the focal shift accurately.
Career Highlights
Alan M Snyder is currently employed at Intel Corporation, where he applies his expertise in metrology to improve semiconductor manufacturing processes. His work is crucial in ensuring the accuracy and reliability of optical systems used in the industry. With 1 patent to his name, he has made significant contributions to the field.
Collaborations
Throughout his career, Alan has collaborated with notable colleagues, including Giang T Dao and Gang Gary Liu. These collaborations have fostered innovation and have been instrumental in advancing their shared goals in the field of metrology.
Conclusion
Alan M Snyder's work in phase metrology exemplifies the impact of innovation in the semiconductor industry. His contributions continue to influence the precision of optical measurements, showcasing the importance of inventors in technological advancement.