Bloomingdale, IL, United States of America

Alan Lee Stone

This inventor holds 1 USPTO granted patent and 3 published patent applications. Top assignee: Yield Engineering Systems, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Alan Lee Stone. Retrieved from https://idiyas.com/inventor/alan-lee-stone

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Alan Lee Stone and His Coating Removal Invention.

Introduction

Alan Lee Stone is an inventor associated with Bloomingdale, Illinois, and Yield Engineering Systems, Inc. His patent work includes an apparatus and method for removing coatings from panels.

Latest Patents

Stone’s listed patent, “Coating Removal Apparatus and Method,” describes equipment with multiple pairs of rotatable brushes spaced along a first direction. Each pair has opposing brushes that rotate about a common axis and move toward or away from one another along a transverse direction. When a coated panel is placed between them, the brushes engage and rotate against opposite panel surfaces. The apparatus can also use liquid tanks, allowing portions of the brushes to contact liquid while treating the panel. Stone is credited with 1 patent.

Career Highlights

Stone’s documented patent contribution focuses on a mechanical process for coating removal. The design combines opposing rotating brushes with liquid contact, offering an integrated approach to treating coated panels.

Collaborations

Stone is associated with Yield Engineering Systems, Inc. His listed coworkers include Kevin Bruce McGillivray and Christopher T. Lane.

Conclusion

Alan Lee Stone’s patent describes a coating-removal system that brings together paired rotating brushes and liquid contact to process coated panels.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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