Bound Brook, NJ, United States of America

Alan Edward Wolke

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Tektronix, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Alan Edward Wolke. Retrieved from https://idiyas.com/inventor/alan-edward-wolke

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Alan Edward Wolke and His Patent in Test and Measurement

Introduction

Alan Edward Wolke is an inventor associated with Bound Brook, New Jersey, and Tektronix, Inc. His patent work concerns the automatic generation of spectrograms in test and measurement instruments. The available information identifies 1 patent associated with him.

Latest Patents

Wolke’s patent, “Automatic Determination of Spectrum and Spectrogram Attributes in a Test and Measurement Instrument,” describes an instrument that generates and displays a spectrogram from an input signal. Its user interface detects a user action, and the spectrogram generator uses that action to produce a second spectrogram image that differs from the first. The patent also describes methods for automatically generating spectrograms in response to user actions.

Career Highlights

Wolke is associated with Tektronix, Inc., a company known for test and measurement technology. His patent reflects work on making spectrogram analysis responsive to user interaction within an instrument.

Collaborations

The provided information names Gary J. Waldo and Barton T. Hickman as Wolke’s coworkers. It does not specify their roles in the patent or describe particular collaborative projects.

Conclusion

Alan Edward Wolke’s identified patent focuses on adapting spectrogram displays to user actions, connecting his work at Tektronix with practical improvements in test and measurement instruments.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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