Köniz, Switzerland

Alain Weber

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Haag-Streit Ag. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Alain Weber. Retrieved from https://idiyas.com/inventor/alain-weber

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Innovations by Alain Weber in Ophthalmic Microscopy

Introduction

Alain Weber is a notable inventor based in Köniz, Switzerland. He has made significant contributions to the field of ophthalmic microscopy, particularly through his innovative patent that enhances image exposure techniques.

Latest Patents

Weber holds a patent for "Image exposure techniques for ophthalmic microscope devices." This invention involves controlling image exposure in an ophthalmic microscope by first recording a camera image using specific exposure parameters. The process includes edge detection to identify regions with varying edge densities. By calculating a brightness parameter that weighs pixel brightness in areas of increased edge density more heavily, the exposure parameters of the microscope can be effectively controlled.

Career Highlights

Alain Weber is associated with Haag-Streit AG, a company known for its advanced ophthalmic instruments. His work at Haag-Streit AG has allowed him to focus on developing innovative solutions that improve the functionality and effectiveness of ophthalmic devices.

Collaborations

Weber collaborates with Philipp Gloor, contributing to the advancement of technology in the field of ophthalmology.

Conclusion

Alain Weber's innovative work in ophthalmic microscopy demonstrates the importance of advancements in medical technology. His patent reflects a significant step forward in improving the precision of ophthalmic devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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