The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2025
Filed:
Jan. 22, 2021
Applicant:
Haag-streit Ag, Köniz, CH;
Inventors:
Alain Weber, Köniz, CH;
Philipp Gloor, Köniz, CH;
Assignee:
Haag-Streit AG, Köniz, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61F 9/007 (2006.01); A61B 3/13 (2006.01); G06T 3/40 (2006.01); G06T 7/13 (2017.01); G06V 10/60 (2022.01); H04N 23/73 (2023.01); H04N 23/74 (2023.01);
U.S. Cl.
CPC ...
H04N 23/73 (2023.01); A61B 3/13 (2013.01); G06T 3/40 (2013.01); G06T 7/13 (2017.01); G06V 10/60 (2022.01); H04N 23/74 (2023.01); G06T 2207/10056 (2013.01);
Abstract
Image exposure in an ophthalmic microscope device is controlled by first recording a camera image with the camera of the microscope using first exposure parameters. Edge detection, e.g., based on convolution using a discrete differential operator, is then used to identify regions where the image has high and low edge densities. A brightness parameter of the camera image is calculated by weighing the pixel brightness in the regions with increased edge density more strongly than in the other regions. The brightness parameter is then used to control the exposure parameters of the microscope.