Coublevie, France

Alain Dubus

This inventor holds 1 USPTO granted patent. Top assignee: Pechiney. Active years: 1989.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Alain Dubus. Retrieved from https://idiyas.com/inventor/alain-dubus-jpky8ndn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 1989

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Innovations of Alain Dubus in Quantitative Analysis

Introduction

Alain Dubus is a notable inventor based in Coublevie, France. He has made significant contributions to the field of quantitative analysis, particularly through his innovative methods that enhance the accuracy of measurements in scientific research.

Latest Patents

Alain Dubus holds a patent for a method of quantitative analysis by means of the mean atomic number. This invention relates to an accurate method for the quantitative determination of the mean atomic number of phases containing two light elements or one light element combined with heavy elements. The method utilizes a scanning microscope connected to an image analyser that measures the intensity of back-scattered electrons. This technique allows for precise analysis with a precision of ±0.1 unit of an unknown phase present in a micrographic section of a sample.

Career Highlights

Throughout his career, Alain Dubus has worked with Pechiney, a company known for its advancements in materials and technology. His work has contributed to the development of innovative analytical techniques that are essential in various scientific fields.

Conclusion

Alain Dubus's contributions to quantitative analysis through his patented methods demonstrate his expertise and commitment to innovation in scientific research. His work continues to influence the field and enhance the accuracy of analytical techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…