The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 1989
Filed:
Mar. 17, 1988
Alain Dubus, Coublevie, FR;
Pechiney, Paris, FR;
Abstract
The invention relates to an accurate method of quantitative analysis by the quantitative determination of the mean atomic number of phases containing two light elements or one light element combined with heavy elements using a scanning microscope connected to an image analyser of the intensity of the back-scattered electrons. This method of quantitative analysis by the quantitative determination of the mean atomic number (Z.sub.1) with a precision of .+-.0.1 unit of an unknown phase present in the plane micrographic section of a sample, containing either two light elements (3.ltoreq.Z.ltoreq.11) or at least one heavy element (Z>12) and a single light element (3.ltoreq.Z.ltoreq.11) using a scanning electron microscope comprising analyser X coupled to an image analyser, the image analyser allowing the local intensity of the back-scattered electrons to be measured by the level of greyness (G) of the corresponding image, this method involving, under given operation conditions: